Rui Abreu, Peter Zoeteweij, Arjan J. C. van Gemund. A New Bayesian Approach to Multiple Intermittent Fault Diagnosis. In Craig Boutilier, editor, IJCAI 2009, Proceedings of the 21st International Joint Conference on Artificial Intelligence, Pasadena, California, USA, July 11-17, 2009. pages 653-658, 2009. [doi]
Abstract is missing.