Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions - researchr publication

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Erkan Acar, Sule Ozev. Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 73-79, IEEE Computer Society, 2005.

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