Jan Ackaert, R. Charavel, K. Dhondt, B. Vlachakis, Luc De Schepper, M. Millecam, E. Vandevelde, P. Bogaert, A. Iline, Eddy De Backer, A. Vlad, Jean-Pierre Raskin. MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. Microelectronics Reliability, 48(8-9):1553-1556, 2008. [doi]
Abstract is missing.