DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage Technique

Saman Adham, Sanjay Gupta. DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage Technique. In 5th Asian Test Symposium (ATS 96), November 20-22, 1996, Hsinchu, Taiwan. pages 205-212, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.