Wasif Afzal. Using Faults-Slip-Through Metric as a Predictor of Fault-Proneness. In Jun Han, Tran Dan Thu, editors, 17th Asia Pacific Software Engineering Conference, APSEC 2010, Sydney, Australia, November 30 - December 3, 2010. pages 414-422, IEEE Computer Society, 2010. [doi]
Abstract is missing.