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Energy and Reliability Improvement of Voltage-Based, Clustered, Coarse-Grain Reconfigurable Architectures by Employing Quality-Aware Mapping

Hassan Afzali-Kusha, Omid Akbari, Mehdi Kamal, Massoud Pedram. Energy and Reliability Improvement of Voltage-Based, Clustered, Coarse-Grain Reconfigurable Architectures by Employing Quality-Aware Mapping. IEEE J. Emerg. Sel. Topics Circuits Syst., 8(3):480-493, 2018. [doi]

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