Kanak Agarwal. On-die sensors for measuring process and environmental variations in integrated circuits. In R. Iris Bahar, Fabrizio Lombardi, David Atienza, Erik Brunvand, editors, Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010. pages 147-150, ACM, 2010. [doi]
Abstract is missing.