Aseem Agarwal, David Blaauw, Vladimir Zolotov. Statistical Clock Skew Analysis Considering Intra-Die Process Variations. In 2003 International Conference on Computer-Aided Design (ICCAD 03), November 9-13, 2003, San Jose, CA, USA. pages 914-921, IEEE Computer Society / ACM, 2003. [doi]
Abstract is missing.