Amit Agarwal, Chris H. Kim, Saibal Mukhopadhyay, Kaushik Roy. Leakage in nano-scale technologies: mechanisms, impact and design considerations. In Sharad Malik, Limor Fix, Andrew B. Kahng, editors, Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004. pages 6-11, ACM, 2004. [doi]
@inproceedings{AgarwalKMR04,
title = {Leakage in nano-scale technologies: mechanisms, impact and design considerations},
author = {Amit Agarwal and Chris H. Kim and Saibal Mukhopadhyay and Kaushik Roy},
year = {2004},
doi = {10.1145/996566.996571},
url = {http://doi.acm.org/10.1145/996566.996571},
tags = {design},
researchr = {https://researchr.org/publication/AgarwalKMR04},
cites = {0},
citedby = {0},
pages = {6-11},
booktitle = {Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004},
editor = {Sharad Malik and Limor Fix and Andrew B. Kahng},
publisher = {ACM},
isbn = {1-58113-828-8},
}