Amit Agarwal, Kunhyuk Kang, Kaushik Roy. Accurate estimation and modeling of total chip leakage considering inter- & intra-die process variations. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 736-741, IEEE Computer Society, 2005.
Abstract is missing.