The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies

Kanak Agarwal, Sani R. Nassif. The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies. IEEE Trans. VLSI Syst., 16(1):86-97, 2008. [doi]

Abstract

Abstract is missing.