Toufik Aggab, Frédéric Kratz, Pascal Vrignat, Manuel Avila. An approach for assessment of level of degradation and RUL estimation for a dynamic systeme. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 3161-3166, IEEE, 2017. [doi]
Abstract is missing.