A similarity measure based on semantic, terminological and linguistic information

Nitish Aggarwal, Tobias Wunner, Mihael Arcan, Paul Buitelaar, Seán O'Riain. A similarity measure based on semantic, terminological and linguistic information. In Pavel Shvaiko, Jérôme Euzenat, Tom Heath, Christoph Quix, Ming Mao, Isabel F. Cruz, editors, Proceedings of the 6th International Workshop on Ontology Matching, Bonn, Germany, October 24, 2011. Volume 814 of CEUR Workshop Proceedings, CEUR-WS.org, 2011. [doi]

Abstract

Abstract is missing.