A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D Stacked ICs

Nima Aghaee, Zebo Peng, Petru Eles. A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D Stacked ICs. J. Electronic Testing, 31(5-6):503-523, 2015. [doi]

Abstract

Abstract is missing.