Pattern matcher for OCR-corrupted documents and its evaluation

Stefan Agne, Hans-G√ľnther Hein. Pattern matcher for OCR-corrupted documents and its evaluation. In Daniel P. Lopresti, Jiangying Zhou, editors, Document Recognition V, San Jose, CA, USA, January 24, 1998. Volume 3305 of SPIE Proceedings, pages 160-168, SPIE, 1998. [doi]

Abstract

Abstract is missing.