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Test Data Generation for Database Applications

Pooja Agrawal, Bikash Chandra, K. Venkatesh Emani, Neha Garg, S. Sudarshan 0001. Test Data Generation for Database Applications. In 34th IEEE International Conference on Data Engineering, ICDE 2018, Paris, France, April 16-19, 2018. pages 1621-1624, IEEE Computer Society, 2018. [doi]

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