Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri. Panel: New Research Problems in the Emerging Test Technology. In 4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India. pages 189, IEEE Computer Society, 1995. [doi]
Abstract is missing.