Reuse-Based Optimization for Prebond and Post-Bond Testing of 3-D-Stacked ICs

Mukesh Agrawal, Krishnendu Chakrabarty, Randy Widialaksono. Reuse-Based Optimization for Prebond and Post-Bond Testing of 3-D-Stacked ICs. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(1):122-135, 2015. [doi]

Abstract

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