Ygor Q. de Aguiar, Cristina Meinhardt, Ricardo A. L. Reis. Radiation sensitivity of XOR topologies in multigate technologies under voltage variability. In 8th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2017, Bariloche, Argentina, February 20-23, 2017. pages 1-4, IEEE, 2017. [doi]
Abstract is missing.