Using Simulated Annealing to Find Lower Bounds of Localization with Noisy Measurements

Farhan Ahammed, Javid Taheri, Albert Y. Zomaya. Using Simulated Annealing to Find Lower Bounds of Localization with Noisy Measurements. In 26th IEEE International Parallel and Distributed Processing Symposium Workshops & PhD Forum, IPDPS 2012, Shanghai, China, May 21-25, 2012. pages 601-608, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.