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Non-Intrusive MC/DC Measurement Based on Traces

Faustin Ahishakiye, Svetlana Jaksic, Felix Dino Lange, Malte Schmitz 0001, Volker Stolz, Daniel Thoma. Non-Intrusive MC/DC Measurement Based on Traces. In Dominique Méry, Shengchao Qin, editors, 2019 International Symposium on Theoretical Aspects of Software Engineering, TASE 2019, Guilin, China, July 29-31, 2019. pages 86-92, IEEE, 2019. [doi]

Authors

Faustin Ahishakiye

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Svetlana Jaksic

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Felix Dino Lange

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Malte Schmitz 0001

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Volker Stolz

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Daniel Thoma

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