Non-Intrusive MC/DC Measurement Based on Traces

Faustin Ahishakiye, Svetlana Jaksic, Felix Dino Lange, Malte Schmitz 0001, Volker Stolz, Daniel Thoma. Non-Intrusive MC/DC Measurement Based on Traces. In Dominique Méry, Shengchao Qin, editors, 2019 International Symposium on Theoretical Aspects of Software Engineering, TASE 2019, Guilin, China, July 29-31, 2019. pages 86-92, IEEE, 2019. [doi]

@inproceedings{AhishakiyeJL0ST19,
  title = {Non-Intrusive MC/DC Measurement Based on Traces},
  author = {Faustin Ahishakiye and Svetlana Jaksic and Felix Dino Lange and Malte Schmitz 0001 and Volker Stolz and Daniel Thoma},
  year = {2019},
  doi = {10.1109/TASE.2019.00-15},
  url = {https://doi.org/10.1109/TASE.2019.00-15},
  researchr = {https://researchr.org/publication/AhishakiyeJL0ST19},
  cites = {0},
  citedby = {0},
  pages = {86-92},
  booktitle = {2019 International Symposium on Theoretical Aspects of Software Engineering, TASE 2019, Guilin, China, July 29-31, 2019},
  editor = {Dominique Méry and Shengchao Qin},
  publisher = {IEEE},
  isbn = {978-1-7281-3342-3},
}