Satyadev Ahlawat, Darshit Vaghani, Jaynarayan T. Tudu, Ashok Suhag. A Cost Effective Technique for Diagnosis of Scan Chain Faults. In Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh, editors, VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. Volume 711 of Communications in Computer and Information Science, pages 191-204, Springer, 2017. [doi]
Abstract is missing.