Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris. Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(12):2120-2133, 2017. [doi]
Abstract is missing.