FRoC 2.0: Automatic BRAM and Logic Testing to Enable Dynamic Voltage Scaling for FPGA Applications

Ibrahim Ahmed 0001, Shuze Zhao, James Meijers, Olivier Trescases, Vaughn Betz. FRoC 2.0: Automatic BRAM and Logic Testing to Enable Dynamic Voltage Scaling for FPGA Applications. TRETS, 12(4), 2019. [doi]

Abstract

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