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Electrical characteristics of MOSFETs with La::2::O::3::/Y::2::O::3:: gate stack

Parhat Ahmet, Kentaro Nakagawa, Kuniyuki Kakushima, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai. Electrical characteristics of MOSFETs with La::2::O::3::/Y::2::O::3:: gate stack. Microelectronics Reliability, 48(11-12):1769-1771, 2008. [doi]

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