Jae-Gyung Ahn, Rhesa Nathanael, I-Ru Chen, Ping-Chin Yeh, Jonathan Chang. Product Lifetime Estimation in 7nm with Large data of Failure Rate and Si-Based Thermal Coupling Model. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.