Bernhard K. Aichernig, Farhad Arbab, Lacramioara Astefanoaei, Frank S. de Boer, Sun Meng, Jan J. M. M. Rutten. Fault-Based Test Case Generation for Component Connectors. In Wei-Ngan Chin, Shengchao Qin, editors, TASE 2009, Third IEEE International Symposium on Theoretical Aspects of Software Engineering, 29-31 July 2009, Tianjin, China. pages 147-154, IEEE Computer Society, 2009. [doi]
Abstract is missing.