Bernhard K. Aichernig, Christian Burghard, Robert Korosec. Learning-Based Testing of an Industrial Measurement Device. In Julia M. Badger, Kristin Yvonne Rozier, editors, NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings. Volume 11460 of Lecture Notes in Computer Science, pages 1-18, Springer, 2019. [doi]
Abstract is missing.