Redundancy & It s Not Just for Defects Anymore

Robert C. Aitken. Redundancy & It s Not Just for Defects Anymore. In 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA. pages 117-120, IEEE Computer Society, 2004. [doi]

Abstract

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