Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage

Robert C. Aitken. Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 128-134, IEEE Computer Society, 1999. [doi]

Abstract

Abstract is missing.