Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken. An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 459, IEEE Computer Society, 1997.
Abstract is missing.