Analog/RF test ordering in the early stages of production testing

Nourredine Akkouche, Salvador Mir, Emmanuel Simeu, Mustapha Slamani. Analog/RF test ordering in the early stages of production testing. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 25-30, IEEE, 2012. [doi]

Abstract

Abstract is missing.