Nihla Akram, Sachini Siriwardene, Malith Jayasinghe, Miyuru Dayarathna, Isuru Perera, Seshika Fernando, Srinath Perera, Upul Bandara, Sriskandarajah Suhothayan. Anomaly Detection of Manufacturing Equipment via High Performance RDF Data Stream Processing: Grand Challenge. In Proceedings of the 11th ACM International Conference on Distributed and Event-based Systems, DEBS 2017, Barcelona, Spain, June 19-23, 2017. pages 280-285, ACM, 2017. [doi]
Abstract is missing.