Waleed K. Al-Assadi, Sindhu Kakarla. Design for Test of Asynchronous NULL Convention Logic (NCL) Circuits. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-9, IEEE, 2008. [doi]
Abstract is missing.