Sultan M. Al-Harbi, Sandeep K. Gupta. An Efficient Methodology for Generating Optimal and Uniform March Tests. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 231-239, IEEE Computer Society, 2001. [doi]
Abstract is missing.