Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey. Testing Digital Circuits with Constraints. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 195-206, IEEE Computer Society, 2002. [doi]
Abstract is missing.