Recycled FPGA Detection Using Exhaustive LUT Path Delay Characterization and Voltage Scaling

Md Mahbub Alam, Mark Tehranipoor, Domenic Forte. Recycled FPGA Detection Using Exhaustive LUT Path Delay Characterization and Voltage Scaling. IEEE Trans. VLSI Syst., 27(12):2897-2910, 2019. [doi]

Abstract

Abstract is missing.