Miguel Alemán-Flores, Luis Álvarez León, Pedro Henríquez, Luis Mazorra. Morphological Thick Line Center Detection. In Aurélio C. Campilho, Mohamed S. Kamel, editors, Image Analysis and Recognition, 7th International Conference, ICIAR 2010, Póvoa de Varzim, Portugal, June 21-23, 2010. Proceedings, Part I. Volume 6111 of Lecture Notes in Computer Science, pages 71-80, Springer, 2010. [doi]
Abstract is missing.