"Plug & Test" at System Level via Testable TLM Primitives

Homa Alemzadeh, Stefano Di Carlo, Fatemeh Refan, Paolo Prinetto, Zainalabedin Navabi. "Plug & Test" at System Level via Testable TLM Primitives. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]

Abstract

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