Dan Alexandrescu, Enrico Costenaro, Michael Nicolaidis. A Practical Approach to Single Event Transients Analysis for Highly Complex Designs. In 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. pages 155-163, IEEE, 2011. [doi]
Abstract is missing.