Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch. Detecting a trojan die in 3D stacked integrated circuits. In 2017 IEEE North Atlantic Test Workshop, NATW 2017, Providence, RI, USA, May 8-10, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.