Hussein Ali, Pietro Caragiulo, Camillo Tamma, Xiaobin Xu, Bojan Markovic, Faisal T. Abu-Nimeh, Dionísio Doering, Angelo Dragone, Gunther Haller. Single-Ended-to-Differential Sampling Technique for Sigma Delta ADCs in X-Ray Detectors. In Hoi Lee, Randall L. Geiger, editors, 62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019. pages 485-488, IEEE, 2019. [doi]
Abstract is missing.