Rashid Ali, You Wang, Zhengyi Hou, Haoyuan Ma, Youguang Zhang, Weisheng Zhao. Process Variation-Resilient STT-MTJ based TRNG using Linear Correcting Codes. In IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2019, Qingdao, China, July 17-19, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.