Variations in Nanometer CMOS Flip-Flops: Part I - Impact of Process Variations on Timing

Massimo Alioto, Elio Consoli, Gaetano Palumbo. Variations in Nanometer CMOS Flip-Flops: Part I - Impact of Process Variations on Timing. IEEE Trans. on Circuits and Systems, 62-I(8):2035-2043, 2015. [doi]

Abstract

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