Wisam Aljubouri, Spyros Tragoudas, Themistoklis Haniotakis. Identification of delay defects on embedded paths using one current sensor. In 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2016, Istanbul, Turkey, April 12-14, 2016. pages 1-4, IEEE, 2016. [doi]
Abstract is missing.