Stéphane Allaire, John J. Kim, Stephen L. Breen, David A. Jaffray, Vladimir Pekar. Full orientation invariance and improved feature selectivity of 3D SIFT with application to medical image analysis. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2008, Anchorage, AK, USA, 23-28 June, 2008. pages 1-8, IEEE, 2008. [doi]
Abstract is missing.