F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, R. Ugioli, G. Zoppi. Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. In 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2019, Cluj-Napoca, Romania, April 24-26, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.