Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test

F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, R. Ugioli, G. Zoppi. Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. In 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2019, Cluj-Napoca, Romania, April 24-26, 2019. pages 1-6, IEEE, 2019. [doi]

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