Uncovering product line variability from early requirement documents

Eduardo Almentero, Elder Cirilo, Carlos José Pereira de Lucena, Julio Cesar Sampaio do Prado Leite, André Luiz de Castro Leal. Uncovering product line variability from early requirement documents. In Third IEEE International Workshop on Requirements Patterns, RePa 2013, Rio de Janeiro, Brazil, July 16, 2013. pages 35-40, IEEE, 2013. [doi]

Abstract

Abstract is missing.